Invention Grant
- Patent Title: Method and device for measuring electromagnetic wave
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Application No.: US12985163Application Date: 2011-01-05
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Publication No.: US08527227B2Publication Date: 2013-09-03
- Inventor: Michinori Shioda
- Applicant: Michinori Shioda
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA Inc. IP Division
- Priority: JP2010-002482 20100108
- Main IPC: G01R23/16
- IPC: G01R23/16

Abstract:
A waveform acquiring unit acquires a time waveform of an electromagnetic wave. The time waveform is decomposed into wavelet expansion coefficients by wavelet transform. Influence levels of the respective wavelet expansion coefficients to a spectrum are calculated. The wavelet expansion coefficients are weighted based on at least the influence levels of the wavelet expansion coefficients to the spectrum. The weighted wavelet expansion coefficients are converted into time waveforms by inverse wavelet transform. Thus, the time waveforms that holds spectrum information needed for spectroscopic analysis and has a reduced noise is provided.
Public/Granted literature
- US20110168896A1 METHOD AND DEVICE FOR MEASURING ELECTROMAGNETIC WAVE Public/Granted day:2011-07-14
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