Invention Grant
- Patent Title: Pattern identification method, parameter learning method and apparatus
- Patent Title (中): 模式识别方法,参数学习方法和装置
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Application No.: US12205174Application Date: 2008-09-05
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Publication No.: US08527439B2Publication Date: 2013-09-03
- Inventor: Kan Torii , Katsuhiko Mori , Yusuke Mitarai , Hiroshi Sato , Yuji Kaneda , Takashi Suzuki
- Applicant: Kan Torii , Katsuhiko Mori , Yusuke Mitarai , Hiroshi Sato , Yuji Kaneda , Takashi Suzuki
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2007-252375 20070927
- Main IPC: G06F17/00
- IPC: G06F17/00

Abstract:
In a pattern identification method in which input data is classified into predetermined classes by sequentially executing a combination of a plurality of classification processes, at least one of the classification processes includes a mapping step of mapping the input data in an N (N≧2) dimensional feature space as corresponding points, a determination step of determining whether or not to execute the next classification process based on the corresponding points, and selecting step of selecting a classification process to be executed next based on the corresponding points when it is determined in the determination step that the next classification process should be executed.
Public/Granted literature
- US20090089235A1 PATTERN IDENTIFICATION METHOD, PARAMETER LEARNING METHOD AND APPARATUS Public/Granted day:2009-04-02
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