A method for calculating an indicator value includes: extracting features, which are mutually independent, by using data stored in a data storage unit storing, for each group of circuits implemented on a semiconductor device, the number of actual failures occurred in the group and a feature value of each feature that is a failure factor; generating an expression of a failure occurrence probability model, which represents a failure occurrence probability, which is obtained by dividing a total sum of the numbers of actual failures by the number of semiconductor devices, as a relation including a sum of products of the feature value of each of the extracted features and a corresponding coefficient, by carrying out a regression calculation using data stored in the data storage unit; and calculating an indicator value for design change of the semiconductor device from the generated expression of the failure occurrence probability model.