Invention Grant
- Patent Title: Test coverage analysis method and apparatus
- Patent Title (中): 测试覆盖分析方法和设备
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Application No.: US12547262Application Date: 2009-08-25
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Publication No.: US08527952B2Publication Date: 2013-09-03
- Inventor: Chun Guang Zeng , Zhi Zhang
- Applicant: Chun Guang Zeng , Zhi Zhang
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cuenot, Forsythe & Kim, LLC
- Priority: CN200810212446 20080826
- Main IPC: G06F9/44
- IPC: G06F9/44
Abstract:
A test coverage analysis method and corresponding apparatus are disclosed, wherein, by executing the program under test using one or more test cases, generating one or more heapdump files containing the call stack information of the program under test, and analyzing the call stack information in the one or more heapdump files, the coverage information of the one or more test cases in terms of functions in the program under test is obtained.
Public/Granted literature
- US20100058300A1 TEST COVERAGE ANALYSIS METHOD AND APPARATUS Public/Granted day:2010-03-04
Information query
