Invention Grant
- Patent Title: System and method to classify automated code inspection services defect output for defect analysis
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Application No.: US12558274Application Date: 2009-09-11
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Publication No.: US08527955B2Publication Date: 2013-09-03
- Inventor: Ian E. Baker , Kathryn A. Bassin , Steven Kagan , Susan E. Skrabanek
- Applicant: Ian E. Baker , Kathryn A. Bassin , Steven Kagan , Susan E. Skrabanek
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Roberts Mlotkowski Safran & Cole, P.C.
- Agent Matthew Chung
- Main IPC: G06F9/44
- IPC: G06F9/44

Abstract:
A method is implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having programming instructions. The programming instructions are operable to receive a tool error output determined by a code inspection tool and select at least one defect classification mapping profile based on the code inspection tool. Additionally, the programming instructions are operable to map the tool error output to one or more output classifications using the selected at least one defect classification mapping profile and generate at least one report based on the one or more output classifications.
Public/Granted literature
- US20110067006A1 SYSTEM AND METHOD TO CLASSIFY AUTOMATED CODE INSPECTION SERVICES DEFECT OUTPUT FOR DEFECT ANALYSIS Public/Granted day:2011-03-17
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