Invention Grant
- Patent Title: Method for positioning an atomic force microscopy tip in a cell
- Patent Title (中): 将原子力显微镜尖端定位在电池中的方法
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Application No.: US13176689Application Date: 2011-07-05
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Publication No.: US08528111B2Publication Date: 2013-09-03
- Inventor: Nazumi Alice Yamada , Bo U. Curry , Chriatian Rankl
- Applicant: Nazumi Alice Yamada , Bo U. Curry , Chriatian Rankl
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: G01Q30/02
- IPC: G01Q30/02

Abstract:
A method for positioning a tip of an atomic force microscope relative to a intracellular target site in a cell is provided. In general terms, the method comprises: a) positioning a fluorescent tip of an atomic force microscope over a cell comprising a fluorescent intracellular target site so that said tip is above target site; b) moving the tip toward said target site while obtaining images of the distal end of said tip and/or the target site using a fluorescence microscope; and c) arresting the movement of the tip when the target site and the distal end of the tip are both in focus in the fluorescence microscope. A microscope system for performing the method is also provided.
Public/Granted literature
- US20130014295A1 METHOD FOR POSITIONING AN ATOMIC FORCE MICROSCOPY TIP IN A CELL Public/Granted day:2013-01-10
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