Invention Grant
- Patent Title: Process for forming thin film encapsulation layers
- Patent Title (中): 用于形成薄膜封装层的工艺
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Application No.: US13303513Application Date: 2011-11-23
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Publication No.: US08529990B2Publication Date: 2013-09-10
- Inventor: Elena A. Fedorovskaya , Michael L. Boroson , David H. Levy , John A. Agostinelli
- Applicant: Elena A. Fedorovskaya , Michael L. Boroson , David H. Levy , John A. Agostinelli
- Applicant Address: US NY Rochester
- Assignee: Eastman Kodak Company
- Current Assignee: Eastman Kodak Company
- Current Assignee Address: US NY Rochester
- Agent William R. Zimmerli
- Main IPC: B05D5/00
- IPC: B05D5/00 ; B05D5/12

Abstract:
A thin film environmental barrier encapsulation process includes providing an electronic device on a substrate, a first reactant gaseous material, a second reactant gaseous material, an inert gaseous material; and a delivery head through which the reactant gaseous materials and the inert gaseous material are simultaneously directed toward the electronic device and the substrate. One or more of the reactant gaseous materials and the inert gaseous material flows through the delivery head. The flow of the one or more of the reactant gaseous materials and the inert gaseous material generates a pressure to create a gas fluid bearing that maintains a substantially uniform distance between the delivery head and the substrate. Relative motion between the delivery head and the substrate causes the second reactant gaseous material to react with at least a portion of the electronic device and the substrate that has been treated with the first reactant gaseous material.
Public/Granted literature
- US20120070942A1 PROCESS FOR FORMING THIN FILM ENCAPSULATION LAYERS Public/Granted day:2012-03-22
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