Invention Grant
- Patent Title: Method for fabricating a semiconductor device
- Patent Title (中): 半导体器件的制造方法
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Application No.: US13736453Application Date: 2013-01-08
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Publication No.: US08530316B2Publication Date: 2013-09-10
- Inventor: Yu-Hung Cheng , Jhi-Cherng Lu , Ming-Hua Yu , Chii-Horng Li , Tze-Liang Lee
- Applicant: Yu-Hung Cheng , Jhi-Cherng Lu , Ming-Hua Yu , Chii-Horng Li , Tze-Liang Lee
- Applicant Address: TW
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW
- Agency: Lowe Hauptman & Ham, LLP
- Main IPC: H01L21/336
- IPC: H01L21/336

Abstract:
A method for fabricating a semiconductor device, the method including growing a first semiconductor structure comprising a first semiconductor material on a surface of a substrate, wherein growing the first semiconductor structure includes forming a semiconductor particle comprising the first semiconductor material on a second semiconductor structure of the semiconductor device. The method further includes forming a protection layer of a second semiconductor material on the first semiconductor structure, wherein forming the protection layer includes forming the protection layer on the semiconductor particle. The method further includes removing a portion of the protection layer, wherein removing the portion of the protection layer includes fully removing the protection layer on the semiconductor particle and the semiconductor particle.
Public/Granted literature
- US20130122675A1 METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE Public/Granted day:2013-05-16
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