Invention Grant
- Patent Title: Method for direct deposition of a germanium layer
- Patent Title (中): 直接沉积锗层的方法
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Application No.: US13347834Application Date: 2012-01-11
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Publication No.: US08530339B2Publication Date: 2013-09-10
- Inventor: Benjamin Vincent , Matty Caymax , Roger Loo , Johan Dekoster
- Applicant: Benjamin Vincent , Matty Caymax , Roger Loo , Johan Dekoster
- Applicant Address: BE Leuven
- Assignee: IMEC
- Current Assignee: IMEC
- Current Assignee Address: BE Leuven
- Agency: McDonnell Boehnen Hulbert & Berghoff LLP
- Priority: EP11150559 20110111
- Main IPC: H01L29/16
- IPC: H01L29/16

Abstract:
The present disclosure is related to a method for the deposition of a continuous layer of germanium on a substrate by chemical vapor deposition. According to the disclosure, a mixture of a non-reactive carrier gas and a higher order germanium precursor gas, i.e. of higher order than germane (GeH4), is applied. In an example embodiment, the deposition is done under application of a deposition temperature between 275° C. and 500° C., with the partial pressure of the precursor gas within the mixture being at least 20 mTorr for temperatures between 275° C. and 285° C., and at least 10 mTorr for temperatures between 285° and 500° C.
Public/Granted literature
- US20120175741A1 Method for Direct Deposition of a Germanium Layer Public/Granted day:2012-07-12
Information query
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