Invention Grant
- Patent Title: Power supply noise measuring circuit and power supply noise measuring method
- Patent Title (中): 电源噪声测量电路和电源噪声测量方法
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Application No.: US12797943Application Date: 2010-06-10
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Publication No.: US08531190B2Publication Date: 2013-09-10
- Inventor: Mikihiro Kajita
- Applicant: Mikihiro Kajita
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2009-178959 20090731
- Main IPC: G01R29/26
- IPC: G01R29/26

Abstract:
A power-supply noise measuring circuit includes a voltage fluctuation detecting circuit, a unit time generating circuit, a current measuring circuit, and a sampling circuit. The voltage fluctuation detecting circuit generates a detection current in accordance with a voltage fluctuation of a power supply. The unit time generating circuit generates a unit time in accordance with a clock signal. The current measuring circuit treasures an amount of the detection current per unit time. The sampling circuit samples the amount of the detection current measured by the current measuring circuit, every unit time. The present invention provides the power-supply noise measuring circuit that has a small circuit area and enough accuracy.
Public/Granted literature
- US20110025346A1 POWER SUPPLY NOISE MEASURING CIRCUIT AND POWER SUPPLY NOISE MEASURING METHOD Public/Granted day:2011-02-03
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