Invention Grant
- Patent Title: Temperature detection device
- Patent Title (中): 温度检测装置
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Application No.: US13236043Application Date: 2011-09-19
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Publication No.: US08531234B2Publication Date: 2013-09-10
- Inventor: Masakazu Sugiura , Atsushi Igarashi
- Applicant: Masakazu Sugiura , Atsushi Igarashi
- Applicant Address: JP Chiba
- Assignee: Seiko Instruments Inc.
- Current Assignee: Seiko Instruments Inc.
- Current Assignee Address: JP Chiba
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2010-242622 20101028; JP2011-054907 20110313
- Main IPC: H03K17/78
- IPC: H03K17/78

Abstract:
Provided is a temperature detection device capable of attaining low current consumption at no expense of detection speed at around a temperature to be detected. The temperature detection device includes a control circuit for outputting a control signal for controlling ON/OFF of such internal circuits as a reference voltage circuit and a comparator. In the control circuit, in order to increase the detection speed at around the temperature to be detected, an oscillation frequency of an oscillation circuit has positive temperature characteristics. Further, the control circuit includes a waveform shaping circuit so as to optimize the waveform of the control signal for controlling ON of the internal circuits, to thereby attain low current consumption.
Public/Granted literature
- US20120105132A1 TEMPERATURE DETECTION DEVICE Public/Granted day:2012-05-03
Information query
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