Invention Grant
US08531304B2 Device and method for measuring material level in bin using flexible resistant members
有权
使用柔性抗弯构件测量料仓中物料料位的装置和方法
- Patent Title: Device and method for measuring material level in bin using flexible resistant members
- Patent Title (中): 使用柔性抗弯构件测量料仓中物料料位的装置和方法
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Application No.: US12936374Application Date: 2008-04-25
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Publication No.: US08531304B2Publication Date: 2013-09-10
- Inventor: Ronald M. Thibault
- Applicant: Ronald M. Thibault
- Applicant Address: US KS Osborne
- Assignee: Osborne Industries Inc.
- Current Assignee: Osborne Industries Inc.
- Current Assignee Address: US KS Osborne
- Agency: Thompson & Thompson, P.A.
- Agent Jeffrey L. Thompson
- International Application: PCT/US2008/061679 WO 20080425
- International Announcement: WO2009/123652 WO 20091008
- Main IPC: G08B21/00
- IPC: G08B21/00

Abstract:
A bin level monitoring system uses one or more monitoring devices (10) to measure a material (23) level in a bin (34). The monitoring devices (10) each have a frame (11) with at least two rigid frame members (12, 13) extending in a longitudinal direction with a space (14) between the frame members. A flexible material (22) covers the frame members (12, 13) and encloses the space (14) there between. A first resistive element (24) and a second resistive or conductive element (30) extend in the longitudinal direction of the device (10) and are arranged to move into contact with each other between the first and second frame members (12, 13) when pressure is applied by bulk material (23) in the bin (34) pressing against an outer surface of the flexible covering (22). An electric circuit (35) connected to the monitoring device (10) measures a total resistance of the free, non-contacted portion of at least one of the first and second elements (24, 30) to provide a measurement of the material level in the bin (34).
Public/Granted literature
- US20110025512A1 DEVICE AND METHOD FOR MEASURING MATERIAL LEVEL IN BIN Public/Granted day:2011-02-03
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