A semiconductor memory device according to the embodiment comprises a memory cell array including first line, second line crossing the first line, and memory cell containing variable resistance element provided on the intersection of the first and second lines; a data write unit operative to cause the variable resistance element to make a transition from a first resistance to a second resistance different from the first resistance; and a resistance state detection unit including an abnormality detection circuit operative to detect a transition of the resistance of the variable resistance element to a third resistance when the data write unit causes the variable resistance element to make the transition from the first resistance to the second resistance (where the third resistance the first resistance>the second resistance).