Invention Grant
- Patent Title: Method and system for fault detection using round trip time
- Patent Title (中): 使用往返时间进行故障检测的方法和系统
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Application No.: US13687824Application Date: 2012-11-28
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Publication No.: US08531973B2Publication Date: 2013-09-10
- Inventor: Moshiur Rahman , Paritosh Bajpay
- Applicant: AT & T Intellectual Property I, L.P.
- Applicant Address: US GA Atlanta
- Assignee: AT & T Intellectual Property I, L.P.
- Current Assignee: AT & T Intellectual Property I, L.P.
- Current Assignee Address: US GA Atlanta
- Agency: Fay Kaplun & Marcin, LLP.
- Main IPC: H04J1/16
- IPC: H04J1/16
Abstract:
A computer readable storage medium stores a set of instructions executable by a processor. The set of instructions is operable to receive, from a user device, a query relating to a degradation of performance of the device within a network; receive, from a transceiver station, a record relating to a time to send data to the device; and identify the existence of an error in the device based on a determination that the time is greater than a predetermined threshold.
Public/Granted literature
- US20130088975A1 Method and System for Fault Detection Using Round Trip Time Public/Granted day:2013-04-11
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