Invention Grant
US08532735B2 Device and method for examination and use of an electrical field in an object under examination containing magnetic particles 有权
用于检查和使用包含磁性颗粒的被检查物体中的电场的装置和方法

  • Patent Title: Device and method for examination and use of an electrical field in an object under examination containing magnetic particles
  • Patent Title (中): 用于检查和使用包含磁性颗粒的被检查物体中的电场的装置和方法
  • Application No.: US10552808
    Application Date: 2004-04-15
  • Publication No.: US08532735B2
    Publication Date: 2013-09-10
  • Inventor: Bernhard Gleich
  • Applicant: Bernhard Gleich
  • Applicant Address: NL Eindhoven
  • Assignee: Koninklijke Philips N.V.
  • Current Assignee: Koninklijke Philips N.V.
  • Current Assignee Address: NL Eindhoven
  • Priority: EP03101023 20030415
  • International Application: PCT/IB2004/050448 WO 20040415
  • International Announcement: WO2004/091390 WO 20041028
  • Main IPC: A61B5/05
  • IPC: A61B5/05 A61N2/02 A61N2/12
Device and method for examination and use of an electrical field in an object under examination containing magnetic particles
Abstract:
The present invention relates to a device for examination and use of an electrical field in a magnetic gradient field, containing magnetic particles in an examination area of an object under examination. The invention also relates to a method of determining the, especially three-dimensional, conductivity distribution in an examination area of an object under examination using a device according to the invention, a method for drug or active ingredient release, especially in locally targeted manner, in an examination area of an object under examination likewise using a device according to the invention, as well as use of a device according to the invention for electro-stimulation.
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