Invention Grant
- Patent Title: System and method for identifying defects of surfaces due to machining processes
- Patent Title (中): 用于识别加工过程中表面缺陷的系统和方法
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Application No.: US12825685Application Date: 2010-06-29
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Publication No.: US08532812B2Publication Date: 2013-09-10
- Inventor: Alan Sullivan , Arun R. Yoganandan
- Applicant: Alan Sullivan , Arun R. Yoganandan
- Applicant Address: US MA Cambridge
- Assignee: Mitsubishi Electric Research Laboratories, Inc.
- Current Assignee: Mitsubishi Electric Research Laboratories, Inc.
- Current Assignee Address: US MA Cambridge
- Agent Dirk Brinkman; Gene Vinokur
- Main IPC: G06F19/00
- IPC: G06F19/00
Abstract:
Embodiments of the invention disclose a method for determining defects of a surface of a model of an object generated from a model of an original object by a simulation of a machining process. The method determines orientations and rate of change in the orientation of the surface based on normal vectors to the surface and identifies the defects of the surface based on the rate of change and a threshold. The threshold is determined based on the machining process.
Public/Granted literature
- US20110320023A1 System and Method for Identifying Defects of Surfaces Due to Machining Processes Public/Granted day:2011-12-29
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