Invention Grant
- Patent Title: Techniques for improved clock offset measuring
- Patent Title (中): 改进时钟偏移测量技术
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Application No.: US12610430Application Date: 2009-11-02
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Publication No.: US08533355B2Publication Date: 2013-09-10
- Inventor: Steven E. Froehlich , Michel H. T. Hack , Xiaoqiao Meng , Li Zhang
- Applicant: Steven E. Froehlich , Michel H. T. Hack , Xiaoqiao Meng , Li Zhang
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Harrington & Smith
- Main IPC: G06F15/16
- IPC: G06F15/16

Abstract:
In an exemplary aspect, method, apparatus, and program products are disclosed suitable for clock offset determination. One method includes performing a number of exchanges of at least single bytes with another network node, where values of the single bytes are different for the exchanges. The method also includes capturing and storing timestamps for each of the number of exchanges performed on the network node. A second method includes capturing and saving arrival timestamps for each of a number of timing messages in a set of timing messages received from another network node. This second method also includes sending the timestamps to at least the another node in response to completion of the set of timing messages.
Public/Granted literature
- US20110106968A1 Techniques For Improved Clock Offset Measuring Public/Granted day:2011-05-05
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