Invention Grant
US08533538B2 Method and apparatus for training a memory signal via an error signal of a memory
有权
用于通过存储器的误差信号训练存储器信号的方法和装置
- Patent Title: Method and apparatus for training a memory signal via an error signal of a memory
- Patent Title (中): 用于通过存储器的误差信号训练存储器信号的方法和装置
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Application No.: US12824675Application Date: 2010-06-28
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Publication No.: US08533538B2Publication Date: 2013-09-10
- Inventor: Santanu Chaudhuri , Joseph H. Salmon , Kuljit S. Bains
- Applicant: Santanu Chaudhuri , Joseph H. Salmon , Kuljit S. Bains
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
Described herein is a method and an apparatus for training a memory signal via an error signal of a memory. The method comprises transmitting from a memory controller a command-address (C/A) signal to a memory module; determining by the memory controller an error in the memory module via an error signal from an error pin of the memory module, the error associated with the C/A signal transmitted to the memory module; and modifying by the memory controller the C/A signal in response to determining an error in the memory module, wherein the error pin is a parity error pin of the memory module, and wherein the memory module comprises a Double Data Rate 4 (DDR4) interface.
Public/Granted literature
- US20110320867A1 METHOD AND APPARATUS FOR TRAINING A MEMORY SIGNAL VIA AN ERROR SIGNAL OF A MEMORY Public/Granted day:2011-12-29
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