Invention Grant
US08533544B2 System for tree sequence testing of a device and method for tree sequence testing of a device in a test framework architecture
有权
用于测试框架架构中的设备的树序列测试的设备和方法的树序列测试系统
- Patent Title: System for tree sequence testing of a device and method for tree sequence testing of a device in a test framework architecture
- Patent Title (中): 用于测试框架架构中的设备的树序列测试的设备和方法的树序列测试系统
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Application No.: US13257334Application Date: 2009-03-31
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Publication No.: US08533544B2Publication Date: 2013-09-10
- Inventor: Cristian Tepus
- Applicant: Cristian Tepus
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- International Application: PCT/IB2009/051353 WO 20090331
- International Announcement: WO2010/112974 WO 20101007
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A system comprises a test framework architecture for tree sequence testing of a device, comprising a plurality of hierarchical layers at least comprising an upmost layer and a lowest layer, each layer of the plurality of hierarchical layers comprising at least one of a plurality of test sequences, each test sequence comprising a plurality of test steps, each test step comprising a current layer information; a test action information for carrying out a test action on the device; and a recovery information for carrying out a recovery action on reception of a recovery call from a next lower layer.
Public/Granted literature
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