Invention Grant
US08533655B1 Method and apparatus for capturing data samples with test circuitry
有权
用测试电路捕获数据样本的方法和装置
- Patent Title: Method and apparatus for capturing data samples with test circuitry
- Patent Title (中): 用测试电路捕获数据样本的方法和装置
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Application No.: US13296511Application Date: 2011-11-15
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Publication No.: US08533655B1Publication Date: 2013-09-10
- Inventor: Samskrut J. Konduru
- Applicant: Samskrut J. Konduru
- Applicant Address: US CA San Jose
- Assignee: Xilinx, Inc.
- Current Assignee: Xilinx, Inc.
- Current Assignee Address: US CA San Jose
- Agent LeRoy D. Maunu; Lois D. Cartier
- Main IPC: G06F17/50
- IPC: G06F17/50
Abstract:
A method is provided for testing a circuit design in a programmable IC. The circuit design and a sampling circuit are implemented in the programmable IC. A first routing circuit is implemented in the programmable IC to route signals from the designated locations of a first subset of a set of test nodes of the circuit design to a set of input nodes of the sampling circuit. Signals are sampled from the first subset of test nodes using the sampling circuit. The programmable IC is partially reconfigured to implement a second routing circuit that replaces the first routing circuit. The second routing circuit is configured to route signals from a second subset of the set of test nodes to the set of input nodes of the sampling circuit. Signals from the second subset of test nodes are sampled using the sampling circuit.
Information query
