Invention Grant
US08541295B2 Pad-less gate-all around semiconductor nanowire FETs on bulk semiconductor wafers
有权
无衬垫栅极 - 散装半导体晶圆上的半导体纳米线FET周围
- Patent Title: Pad-less gate-all around semiconductor nanowire FETs on bulk semiconductor wafers
- Patent Title (中): 无衬垫栅极 - 散装半导体晶圆上的半导体纳米线FET周围
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Application No.: US13759641Application Date: 2013-02-05
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Publication No.: US08541295B2Publication Date: 2013-09-24
- Inventor: Jeffrey W. Sleight , Josephine B. Chang , Isaac Laurer , Shreesh Narasimha
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Agent H. Daniel Schnurmann
- Main IPC: H01L21/66
- IPC: H01L21/66

Abstract:
A non-planar semiconductor device is provided including at least one semiconductor nanowire suspended above a semiconductor oxide layer present within a portion of a bulk semiconductor substrate. The semiconductor oxide layer has a topmost surface that is coplanar with a topmost surface of the bulk semiconductor substrate. A gate surrounds a portion of the at least one suspended semiconductor nanowire, a source region located on a first side of the gate, and a drain region located on a second side of the gate. The source region is in direct contact with an exposed end portion of the at least one suspended semiconductor nanowire, and the drain region is in direct contact with another exposed end portion of the at least one suspended semiconductor nanowire. The source and drain regions have an epitaxial relationship with the exposed end portions of the suspended semiconductor nanowire.
Public/Granted literature
- US20130224924A1 PAD-LESS GATE-ALL AROUND SEMICONDUCTOR NANOWIRE FETS ON BULK SEMICONDUCTOR WAFERS Public/Granted day:2013-08-29
Information query
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