Invention Grant
- Patent Title: High throughput epitaxial lift off for flexible electronics
- Patent Title (中): 高通量外延剥离柔性电子元件
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Application No.: US13236119Application Date: 2011-09-19
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Publication No.: US08541315B2Publication Date: 2013-09-24
- Inventor: Cheng-Wei Cheng , Kuen-Ting Shiu
- Applicant: Cheng-Wei Cheng , Kuen-Ting Shiu
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Agent Louis J. Percello, Esq.
- Main IPC: H01L21/302
- IPC: H01L21/302

Abstract:
A method of removing a semiconductor device layer from an underlying base substrate is provided in which a sacrificial phosphide-containing layer is formed between a semiconductor device layer and a base substrate. In some embodiments, a semiconductor buffer layer can be formed on an upper surface of the base substrate prior to forming the sacrificial phosphide-buffer layer. The resultant structure is then etched utilizing a non-HF etchant to release the semiconductor device layer from the base semiconductor substrate. After releasing the semiconductor device layer from the base substrate, the base substrate can be re-used.
Public/Granted literature
- US20130071999A1 HIGH THROUGHPUT EPITAXIAL LIFT OFF FOR FLEXIBLE ELECTRONICS Public/Granted day:2013-03-21
Information query
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