Invention Grant
US08541762B2 Charged particle irradiation device and method 有权
带电粒子照射装置及方法

  • Patent Title: Charged particle irradiation device and method
  • Patent Title (中): 带电粒子照射装置及方法
  • Application No.: US13637096
    Application Date: 2011-03-30
  • Publication No.: US08541762B2
    Publication Date: 2013-09-24
  • Inventor: Yves ClaereboudtGregory Saive
  • Applicant: Yves ClaereboudtGregory Saive
  • Applicant Address: BE Louvain-la-Neuve
  • Assignee: Ion Beam Applications SA
  • Current Assignee: Ion Beam Applications SA
  • Current Assignee Address: BE Louvain-la-Neuve
  • Agent Christopher Casieri
  • Priority: EP10158873 20100331
  • International Application: PCT/EP2011/054940 WO 20110330
  • International Announcement: WO2011/121037 WO 20111006
  • Main IPC: A61N5/00
  • IPC: A61N5/00
Charged particle irradiation device and method
Abstract:
A charged particle irradiation device (10) and method for irradiating a target volume (50), adapted for receiving a treatment plan (70) defining a series of prescribed irradiation points (140) having each a prescribed dose to be delivered is provided. The device includes an irradiation unit (40) having at least one scanning magnet (100; 110), and at least one beam position monitor (130) installed in between the said scanning magnet (100; 110) and said target volume (50) is provided. A controller (80) comprises means for calculating for any said prescribed irradiation point corresponding nominal magnetic settings of the scanning magnet such that a beam (90) is pointing to said prescribed irradiation point when corresponding magnetic settings are applied, and means for calculating corresponding expected position at said beam position monitor (130) according to said first correction.
Public/Granted literature
Information query
Patent Agency Ranking
0/0