Invention Grant
- Patent Title: Nonvolatile memory device and nonvolatile memory apparatus
- Patent Title (中): 非易失性存储器件和非易失性存储器件
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Application No.: US13043097Application Date: 2011-03-08
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Publication No.: US08541766B2Publication Date: 2013-09-24
- Inventor: Takeshi Yamaguchi , Chikayoshi Kamata
- Applicant: Takeshi Yamaguchi , Chikayoshi Kamata
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: H01L29/02
- IPC: H01L29/02 ; H01L29/06 ; G11C11/00

Abstract:
According to one embodiment, a nonvolatile memory device includes a recording layer and a conductive first layer. The recording layer includes a main group element, a transition element, and oxygen. The recording layer is capable of recording information by changing reversibly between a high resistance state and a low resistance state. The first layer is made of at least one selected from a metal, a metal oxide, a metal nitride, and a metal carbide. The first layer is provided adjacent to the recording layer. The first layer includes the main group element with a concentration lower than a concentration of the main group element of the recording layer.
Public/Granted literature
- US20110216575A1 NONVOLATILE MEMORY DEVICE AND NONVOLATILE MEMORY APPARATUS Public/Granted day:2011-09-08
Information query
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