Invention Grant
US08542003B2 Test apparatus to test a data signal and a clock signal output from a device under test
失效
用于测试从被测器件输出的数据信号和时钟信号的测试装置
- Patent Title: Test apparatus to test a data signal and a clock signal output from a device under test
- Patent Title (中): 用于测试从被测器件输出的数据信号和时钟信号的测试装置
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Application No.: US13055982Application Date: 2009-07-29
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Publication No.: US08542003B2Publication Date: 2013-09-24
- Inventor: Tomohiro Uetmatsu
- Applicant: Tomohiro Uetmatsu
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Ladas & Parry, LLP
- Priority: JP2008-199987 20080801
- International Application: PCT/JP2009/003590 WO 20090729
- International Announcement: WO2010/013464 WO 20100204
- Main IPC: G01R23/175
- IPC: G01R23/175 ; H01H47/18 ; H03L7/00 ; H03H11/26

Abstract:
A first timing comparator TCP1 latches a data signal at a timing that corresponds to each edge of a first strobe signal. A first delay element delays a first strobe signal so as to output a first delayed strobe signal. A first clock recovery unit makes a comparison between the phase of the first delayed strobe signal and a clock signal, and outputs a first reference strobe signal which is used to perform phase adjustment such that the phases of these signals match each other. A third delay element delays a first reference strobe signal, and outputs the signal thus delayed as the first strobe signal. A delay amount that corresponds to the amount of skew that occurs between the data signal and the clock signal is set for the third delay element.
Public/Granted literature
- US20110121814A1 TEST APPARATUS Public/Granted day:2011-05-26
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