Invention Grant
US08542003B2 Test apparatus to test a data signal and a clock signal output from a device under test 失效
用于测试从被测器件输出的数据信号和时钟信号的测试装置

  • Patent Title: Test apparatus to test a data signal and a clock signal output from a device under test
  • Patent Title (中): 用于测试从被测器件输出的数据信号和时钟信号的测试装置
  • Application No.: US13055982
    Application Date: 2009-07-29
  • Publication No.: US08542003B2
    Publication Date: 2013-09-24
  • Inventor: Tomohiro Uetmatsu
  • Applicant: Tomohiro Uetmatsu
  • Applicant Address: JP Tokyo
  • Assignee: Advantest Corporation
  • Current Assignee: Advantest Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Ladas & Parry, LLP
  • Priority: JP2008-199987 20080801
  • International Application: PCT/JP2009/003590 WO 20090729
  • International Announcement: WO2010/013464 WO 20100204
  • Main IPC: G01R23/175
  • IPC: G01R23/175 H01H47/18 H03L7/00 H03H11/26
Test apparatus to test a data signal and a clock signal output from a device under test
Abstract:
A first timing comparator TCP1 latches a data signal at a timing that corresponds to each edge of a first strobe signal. A first delay element delays a first strobe signal so as to output a first delayed strobe signal. A first clock recovery unit makes a comparison between the phase of the first delayed strobe signal and a clock signal, and outputs a first reference strobe signal which is used to perform phase adjustment such that the phases of these signals match each other. A third delay element delays a first reference strobe signal, and outputs the signal thus delayed as the first strobe signal. A delay amount that corresponds to the amount of skew that occurs between the data signal and the clock signal is set for the third delay element.
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