Invention Grant
- Patent Title: Mutual capacitance measurement in a multi-touch input device
- Patent Title (中): 多点触摸输入设备中的互电容测量
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Application No.: US13089786Application Date: 2011-04-19
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Publication No.: US08542215B2Publication Date: 2013-09-24
- Inventor: Jerry Hanauer , Todd O'Connor
- Applicant: Jerry Hanauer , Todd O'Connor
- Applicant Address: US AZ Chandler
- Assignee: Microchip Technology Incorporated
- Current Assignee: Microchip Technology Incorporated
- Current Assignee Address: US AZ Chandler
- Agency: Keating & Spalding L.L.P.
- Main IPC: G06F3/044
- IPC: G06F3/044

Abstract:
Systems and methods for determining multiple touch events in a multi-touch sensor system are provided. The system may include a capacitance measurement unit, a pulse drive unit, and a touch sensor having a plurality of nodes and a plurality of electrodes comprising at least two sets of electrodes. The method may include connecting a first electrode in a first set to the capacitance measurement unit, the pulse drive unit driving a voltage or current pulse onto a second electrode in a second set of electrodes. The method may further include the capacitance measurement unit measuring the mutual capacitance at a node corresponding to the first and second electrodes. The method may include comparing the measured mutual capacitance at the node with a previously measured mutual capacitance for the node, and reporting that the node has been touched if there has been a deviation from the previously measured mutual capacitance.
Public/Granted literature
- US20110267309A1 MUTUAL CAPACITANCE MEASUREMENT IN A MULTI-TOUCH INPUT DEVICE Public/Granted day:2011-11-03
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