Invention Grant
- Patent Title: Arrangement and a method for controlling a measurement head of an optical measurement instrument
- Patent Title (中): 用于控制光学测量仪器的测量头的布置和方法
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Application No.: US13145652Application Date: 2010-01-18
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Publication No.: US08542349B2Publication Date: 2013-09-24
- Inventor: Jyrki Laitinen , Markku Ojala , Jarkko Sarmaala , Christer Isaksson
- Applicant: Jyrki Laitinen , Markku Ojala , Jarkko Sarmaala , Christer Isaksson
- Applicant Address: SG Singapore
- Assignee: Perkinelmer Singapore Pte. Ltd.
- Current Assignee: Perkinelmer Singapore Pte. Ltd.
- Current Assignee Address: SG Singapore
- Agency: Young & Thompson
- Priority: FI20095064U 20090126
- International Application: PCT/FI2010/050022 WO 20100118
- International Announcement: WO2010/084244 WO 20100729
- Main IPC: G01B11/16
- IPC: G01B11/16

Abstract:
An optical measurement instrument includes a measurement head and mechanical support elements arranged to support a sample well plate. The measurement head is moved towards the sample well plate and, after the measurement head has touched the sample well plate, the measurement head is moved backwards away from the sample well plate so as to provide a desired distance between the measurement head and the sample well plate. A sensor device is attached to the mechanical support elements and arranged detect a mechanical effect occurring in the mechanical support elements due to force directed by the measurement head to the sample well plate. Hence, the situation in which the measurement head touches the sample well plate can be detected without a need to provide the measurement head with a force sensor. This is advantageous because the measurement head can be a changeable module of the optical measurement instrument.
Public/Granted literature
- US20120002190A1 ARRANGEMENT AND A METHOD FOR CONTROLLING A MEASUREMENT HEAD OF AN OPTICAL MEASUREMENT INSTRUMENT Public/Granted day:2012-01-05
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