Invention Grant
US08542793B1 System for measuring sample pore using computed tomography and standard sample and method thereof
有权
使用计算机断层扫描和标准样品测量样品孔的系统及其方法
- Patent Title: System for measuring sample pore using computed tomography and standard sample and method thereof
- Patent Title (中): 使用计算机断层扫描和标准样品测量样品孔的系统及其方法
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Application No.: US13989141Application Date: 2011-09-30
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Publication No.: US08542793B1Publication Date: 2013-09-24
- Inventor: Jae Hwa Jin , Jun Ho Kim , Min Jun Kim
- Applicant: Jae Hwa Jin , Jun Ho Kim , Min Jun Kim
- Applicant Address: KR Daejeon
- Assignee: Korea Institute of Geoscience and Mineral Resources (KIGAM)
- Current Assignee: Korea Institute of Geoscience and Mineral Resources (KIGAM)
- Current Assignee Address: KR Daejeon
- Agency: Rabin & Berdo, P.C.
- Priority: KR10-2011-0034399 20110413
- International Application: PCT/KR2011/007269 WO 20110930
- International Announcement: WO2012/141392 WO 20121018
- Main IPC: G01B15/02
- IPC: G01B15/02 ; G01N23/06

Abstract:
The present invention relates to a system for measuring a sample pore using a computed tomography (CT) and a standard sample and to a method thereof, more particularly to a system for measuring a sample pore using a computed tomography (CT) and a standard sample and to a method thereof, wherein the number of pixels in the count range of a cross-sectional image of the measurement sample and the number of pixels corresponding to the gray level range of the pore are calculated with reference to the count range utilized in the cross-sectional image of the standard sample and the gray level range of the pore so as to accurately measure the porosity of the measurement sample after performing a CT scan of the standard sample and the measurement sample together using a CT scanner.
Public/Granted literature
- US20130251095A1 SYSTEM FOR MEASURING SAMPLE PORE USING COMPUTED TOMOGRAPHY AND STANDARD SAMPLE AND METHOD THEREOF Public/Granted day:2013-09-26
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