Invention Grant
US08542795B2 Method for obtaining high-contrast X-ray images and X-ray beam detector
有权
用于获得高对比度X射线图像和X射线束检测器的方法
- Patent Title: Method for obtaining high-contrast X-ray images and X-ray beam detector
- Patent Title (中): 用于获得高对比度X射线图像和X射线束检测器的方法
-
Application No.: US13105502Application Date: 2011-05-11
-
Publication No.: US08542795B2Publication Date: 2013-09-24
- Inventor: Philipp Bernhardt
- Applicant: Philipp Bernhardt
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: King & Spalding L.L.P.
- Priority: DE102010020611 20100514
- Main IPC: G01N23/04
- IPC: G01N23/04

Abstract:
An X-ray radiation detector (100) consists of an arrangement with photodetector elements (12) and a scintillator layer (14) on the same. It is assumed in an exemplary fashion that the scintillator layer (14) subjects an input signal, which describes an object to be imaged, to a convolution with a modulation transfer function. The effect of this can be cancelled, particularly by obtaining a test X-ray image in advance, with the aid of which this modulation transfer function, or a similar variable providing information on the modulation transfer function, is established. If use is made of photodetectors that are based on CMOS technology, use can be made of a particularly thick scintillator layer made of gadolinium oxysulfide, which absorbs a particularly large amount of X-ray radiation. High-contrast X-ray images are obtained in this fashion.
Public/Granted literature
- US20110280370A1 METHOD FOR OBTAINING HIGH-CONTRAST X-RAY IMAGES AND X-RAY BEAM DETECTOR Public/Granted day:2011-11-17
Information query