Invention Grant
- Patent Title: System and process for roof measurement using aerial imagery
- Patent Title (中): 使用航空图像进行屋顶测量的系统和过程
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Application No.: US13774478Application Date: 2013-02-22
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Publication No.: US08542880B2Publication Date: 2013-09-24
- Inventor: Dale R. Thornberry , Chris T. Thornberry , Mark F. Garringer
- Applicant: Pictometry International Corp.
- Applicant Address: US NY Rochester
- Assignee: Pictometry International Corp.
- Current Assignee: Pictometry International Corp.
- Current Assignee Address: US NY Rochester
- Agency: Dunlap Codding, P.C.
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
Processes and systems are disclosed for determining attributes of a roof structure of real-world three-dimensional building(s), including providing computer input field(s) for a user to input location data generally corresponding to the location of the building, providing visual access to a nadir image of a region including the roof structure of the building; on the nadir image of the region, providing a visual marker that is moveable on the computer monitor around the region, the visual marker initially corresponding to the location data but which may be moved to a final location, having location coordinates, on top of the building to more precisely identify the location of the building roof structure; providing a computer input capable of signaling user-acceptance of the final location of the marker; and, providing visual access to one or more oblique images of an aerial imagery database corresponding to location coordinates of the final location.
Public/Granted literature
- US20130170694A1 System and Process for Roof Measurement Using Aerial Imagery Public/Granted day:2013-07-04
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