Invention Grant
- Patent Title: Methods, apparatus and articles of manufacture to characterize applications
- Patent Title (中): 用于表征应用的方法,设备和制品
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Application No.: US12711762Application Date: 2010-02-24
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Publication No.: US08543359B2Publication Date: 2013-09-24
- Inventor: Bruno Abrahao , Alex X. Zhang
- Applicant: Bruno Abrahao , Alex X. Zhang
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Main IPC: G06F7/60
- IPC: G06F7/60 ; G06F15/173

Abstract:
Example methods, apparatus and articles of manufacture to characterize applications are disclosed. A disclosed example method includes collecting resource utilization trace data from the two or more applications simultaneously running on one or more computational devices, determining an intrinsic dimensionality of the collected trace data, the intrinsic dimensionality representing a number of predominate features that substantially characterize the trace data, and characterizing each application's workload based on the determined intrinsic dimensionality.
Public/Granted literature
- US20100153319A1 METHODS, APPARATUS AND ARTICLES OF MANUFACTURE TO CHARACTERIZE APPLICATIONS Public/Granted day:2010-06-17
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