Invention Grant
US08546267B2 Method of processing a workpiece in a plasma reactor using multiple zone feed forward thermal control 有权
使用多区域前馈热控制在等离子体反应器中处理工件的方法

Method of processing a workpiece in a plasma reactor using multiple zone feed forward thermal control
Abstract:
A method of controlling wafer temperature in a plasma reactor by obtaining the next scheduled change in RF heat load on the workpiece, and using thermal modeling to estimate respective changes in wafer backside gas pressure and in coolant flow through a wafer support pedestal that would compensate for the next scheduled change in RF heat load, and making the respective changes in the backside gas pressure or in the coolant flow prior to the time of the next scheduled change.
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