Invention Grant
US08546870B2 Semiconductor devices having gate structures with conductive patterns of different widths and methods of fabricating such devices
有权
具有具有不同宽度的导电图案的栅极结构的半导体器件和制造这种器件的方法
- Patent Title: Semiconductor devices having gate structures with conductive patterns of different widths and methods of fabricating such devices
- Patent Title (中): 具有具有不同宽度的导电图案的栅极结构的半导体器件和制造这种器件的方法
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Application No.: US12622594Application Date: 2009-11-20
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Publication No.: US08546870B2Publication Date: 2013-10-01
- Inventor: Ju-Hyung Kim , Chang-Seok Kang , Sung-Il Chang , Young-Woo Park , Jung-Dal Choi
- Applicant: Ju-Hyung Kim , Chang-Seok Kang , Sung-Il Chang , Young-Woo Park , Jung-Dal Choi
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel Sibley & Sajovec, P.A.
- Priority: KR10-2008-0119886 20081128
- Main IPC: H01L29/792
- IPC: H01L29/792

Abstract:
A semiconductor device and a method of fabricating the same are provided. The semiconductor device includes a first dielectric pattern, a data storage pattern and a second dielectric pattern, which are sequentially stacked on a semiconductor substrate. A first conductive pattern is provided on the second dielectric pattern. A second conductive pattern having a greater width than the first conductive pattern is provided on the first conductive pattern.
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