Invention Grant
US08547021B2 Plasma processing apparatus 有权
等离子体处理装置

  • Patent Title: Plasma processing apparatus
  • Patent Title (中): 等离子体处理装置
  • Application No.: US13127665
    Application Date: 2009-10-20
  • Publication No.: US08547021B2
    Publication Date: 2013-10-01
  • Inventor: Gang Wei
  • Applicant: Gang Wei
  • Applicant Address: CN Beijing
  • Assignee: Beijing NMC Co. Ltd.
  • Current Assignee: Beijing NMC Co. Ltd.
  • Current Assignee Address: CN Beijing
  • Agency: Edwards Wildman Palmer LLP
  • Agent Howard M. Gitten
  • Priority: CN200810224715 20081209
  • International Application: PCT/CN2009/074532 WO 20091020
  • International Announcement: WO2010/066151 WO 20100617
  • Main IPC: H01J7/24
  • IPC: H01J7/24
Plasma processing apparatus
Abstract:
A plasma processing device includes a first electrode plate (3), a second electrode plate (4), a matching device (8), a power distribution device (9) and a power supply device (1). The first electrode plate (3) includes at least two sub-electrode plates (31, 32) insulated from each other; the power supply device (1) is connected to the power distribution device (9) via the matching device (8); the power distribution device (9) is connected to the first electrode plate (3) for inputting and distributing the power of the power supply device (1) to each of the sub-electrode plates (31, 32); the power distribution device (9) at least includes capacitors (C1, C2) and/or inductances (L1, L2). The plasma processing device distributes the power of the power supply device (1) into several portions corresponding to the number of the sub-electrodes (31, 32) through the power distribution device (9), and each portion of the power is individually inputted to the corresponding sub-electrode (31, 32) to acquire individual electric field distribution between each sub-electrode plate (31, 32) and the second electrode plate (4).
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