Invention Grant
- Patent Title: Semiconductor device and pulse width detection method
- Patent Title (中): 半导体器件和脉冲宽度检测方法
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Application No.: US13012869Application Date: 2011-01-25
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Publication No.: US08547082B2Publication Date: 2013-10-01
- Inventor: Akihiro Hirota
- Applicant: Akihiro Hirota
- Applicant Address: JP Tokyo
- Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Volentine & Whitt, PLLC
- Priority: JP2010-016654 20100128
- Main IPC: G01R13/00
- IPC: G01R13/00 ; H03K3/00

Abstract:
An internal pulse waveform shaping circuit provided to an IC chip generates an internal pulse monitor signal that changes in a predetermined direction at a rise timing of an internal pulse signal during a period in which a first enable signal is asserted and a second enable signal is de-asserted and then continues in the changed state for a predetermined period of time or longer, and generates the internal pulse monitor signal that changes in the predetermined direction at a fall timing of the pulse signal during a period in which the first enable signal is de-asserted and the second enable signal is asserted and then continues in the changed state for the predetermined period of time or longer. The generated internal pulse monitor signal is output to a tester for detecting the pulse width of the internal pulse signal.
Public/Granted literature
- US20110181329A1 SEMICONDUCTOR DEVICE AND PULSE WIDTH DETECTION METHOD Public/Granted day:2011-07-28
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