Invention Grant
- Patent Title: System and method for observing threshold voltage variations
- Patent Title (中): 观察阈值电压变化的系统和方法
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Application No.: US12688025Application Date: 2010-01-15
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Publication No.: US08547131B2Publication Date: 2013-10-01
- Inventor: Chung-Hsing Wang , Chih-Chieh Chen , Yi-Wei Chen
- Applicant: Chung-Hsing Wang , Chih-Chieh Chen , Yi-Wei Chen
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
A system and method for observing threshold voltage variations are provided. A ring oscillator circuit comprises a plurality of inverters arranged in a sequential loop, a plurality of test circuits having devices under test, each coupled between a respective one of the inverters and a power supply. Each test circuit has a bypass field effect transistor (FET) having a first channel coupled between the power supply and a respective one of the inverters responsive to an individual enable signal, and a FET device under test having a second channel arranged in parallel to the first channel. A method is described for determining the threshold voltage of the device under test by disabling, for one of the inverters in the ring oscillator, the first FET device such that the device under test is coupled between the power supply and the respective inverter and affects the operating frequency of the ring oscillator.
Public/Granted literature
- US20100253382A1 System and Method for Observing Threshold Voltage Variations Public/Granted day:2010-10-07
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