Invention Grant
- Patent Title: Analog unit
- Patent Title (中): 模拟单元
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Application No.: US13254204Application Date: 2009-05-29
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Publication No.: US08547256B2Publication Date: 2013-10-01
- Inventor: Haruyuki Kurachi
- Applicant: Haruyuki Kurachi
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- International Application: PCT/JP2009/059890 WO 20090529
- International Announcement: WO2010/137168 WO 20101202
- Main IPC: H03M1/06
- IPC: H03M1/06

Abstract:
An ADC code given in response to input of an analog input value to an A/D converter circuit is measured at a site where an A/D converter unit is used to measure a user-measured value. A user-set value calculating part calculates a user offset value and a user gain value on the basis of one user-measured value, a factory offset value, and a factory gain value, and stores the calculated user offset value and the user gain value in a nonvolatile memory.
Public/Granted literature
- US20110316730A1 ANALOG UNIT Public/Granted day:2011-12-29
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