Invention Grant
- Patent Title: Detection method and detection apparatus
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Application No.: US13568897Application Date: 2012-08-07
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Publication No.: US08547559B2Publication Date: 2013-10-01
- Inventor: Yoshiaki Kito , Masanori Arai , Tatsuo Fukui
- Applicant: Yoshiaki Kito , Masanori Arai , Tatsuo Fukui
- Applicant Address: JP Tokyo
- Assignee: Nikon Corporation
- Current Assignee: Nikon Corporation
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2010-025935 20100208
- Main IPC: G02B13/14
- IPC: G02B13/14

Abstract:
A detection method of detecting a position of an uppermost substrate of a plurality of substrates stacked on each other includes applying illumination to a region covering a portion of an edge of the uppermost substrate and a portion of a lower substrate stacked with the uppermost substrate, identifying a position of the edge of the uppermost substrate based on a position of a step-like portion present in the region due to a step formed between the uppermost substrate and the lower substrate, and identifying a position of the uppermost substrate based on the position of the edge of the uppermost substrate.
Public/Granted literature
- US20130033712A1 DETECTION METHOD AND DETECTION APPARATUS Public/Granted day:2013-02-07
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