Invention Grant
US08548117B2 Semicircular inversed offset scanning for enlarged field of view 3D 失效
半圆形倒置偏移扫描,用于放大视野3D

  • Patent Title: Semicircular inversed offset scanning for enlarged field of view 3D
  • Patent Title (中): 半圆形倒置偏移扫描,用于放大视野3D
  • Application No.: US13139329
    Application Date: 2009-12-08
  • Publication No.: US08548117B2
    Publication Date: 2013-10-01
  • Inventor: Nicolaas Jan Noordhoek
  • Applicant: Nicolaas Jan Noordhoek
  • Applicant Address: NL Eindhoven
  • Assignee: Koninklijke Philips N.V.
  • Current Assignee: Koninklijke Philips N.V.
  • Current Assignee Address: NL Eindhoven
  • Priority: EP08171597 20081215
  • International Application: PCT/IB2009/055572 WO 20091208
  • International Announcement: WO2010/070527 WO 20100624
  • Main IPC: A61B6/03
  • IPC: A61B6/03
Semicircular inversed offset scanning for enlarged field of view 3D
Abstract:
A computed tomography acquisition method, an imaging system, a computer readable medium provides laterally displacing a radiation detector (204) from a position with centered detector geometry with a centered transverse field of view to a first offset position (212); emitting first radiation by the radiation source (202), detecting the first radiation by the radiation detector (204) and acquiring projection data indicative of the first radiation; rotating the support around the rotational axis (214) by 180°; emitting second radiation by the radiation source (202), detecting the second radiation by the radiation detector (204) and acquiring projection data indicative of the second radiation; displacing the radiation detector (204) from the first offset position to a second offset position (226), with opposite direction and double length of the first displacement (a); emitting third radiation by the radiation source (202), detecting the third radiation by the radiation detector (204) and acquiring projection data indicative of the third radiation; rotating the support around the rotational axis (214) by 180°; and emitting fourth radiation by the radiation source (202), detecting the fourth radiation by the radiation detector (204) and acquiring projection data indicative of the fourth radiation.
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