Invention Grant
US08549363B2 Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components
失效
通过基于功能组件的预先磨损的激活来实现片上系统的可靠性和性能
- Patent Title: Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components
- Patent Title (中): 通过基于功能组件的预先磨损的激活来实现片上系统的可靠性和性能
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Application No.: US12727967Application Date: 2010-03-19
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Publication No.: US08549363B2Publication Date: 2013-10-01
- Inventor: Chen-Yong Cher , Paul W. Coteus , Alan Gara , Eren Kursun , David P. Paulsen , Brian A. Schuelke , John E. Sheets, II , Shurong Tian
- Applicant: Chen-Yong Cher , Paul W. Coteus , Alan Gara , Eren Kursun , David P. Paulsen , Brian A. Schuelke , John E. Sheets, II , Shurong Tian
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Agent Daniel P. Morris, Esq.
- Main IPC: G06F11/30
- IPC: G06F11/30
Abstract:
A processor-implemented method for determining aging of a processing unit in a processor the method comprising: calculating an effective aging profile for the processing unit wherein the effective aging profile quantifies the effects of aging on the processing unit; combining the effective aging profile with process variation data, actual workload data and operating conditions data for the processing unit; and determining aging through an aging sensor of the processing unit using the effective aging profile, the process variation data, the actual workload data, architectural characteristics and redundancy data, and the operating conditions data for the processing unit.
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