Invention Grant
- Patent Title: On-chip functional debugger and a method of providing on-chip functional debugging
- Patent Title (中): 片上功能调试器和提供片上功能调试的方法
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Application No.: US12982611Application Date: 2010-12-30
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Publication No.: US08549370B2Publication Date: 2013-10-01
- Inventor: Parul Bansal
- Applicant: Parul Bansal
- Applicant Address: NL Amsterdam
- Assignee: STMicroelectronics International N. V.
- Current Assignee: STMicroelectronics International N. V.
- Current Assignee Address: NL Amsterdam
- Agency: Wolf, Greenfield & Sacks, P.C.
- Priority: IN2742/DEL/2009 20091230
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
An on-chip functional debugger includes one or more functional blocks each providing one or more functional outputs. A hierarchical selection tree is formed by one or more selectors having the output of one of the selectors as a final output and individual selector inputs coupled either to a functional output from the functional blocks or to an output of another selector. A selection signal coupled to the select input of each of the selectors to enable a selected one of its output. An output node coupled to the final output. A method of providing on-chip functional debugging is also provided. A desired functional output from one or more available functional outputs is selected and then the selected functional output is coupled to an output node.
Public/Granted literature
- US20110161760A1 ON-CHIP FUNCTIONAL DEBUGGER AND A METHOD OF PROVIDING ON-CHIP FUNCTIONAL DEBUGGING Public/Granted day:2011-06-30
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