Invention Grant
- Patent Title: Classifying a criticality of a soft error and mitigating the soft error based on the criticality
- Patent Title (中): 分类软错误的关键性，并根据关键性减轻软错误
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Application No.: US12950171Application Date: 2010-11-19
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Publication No.: US08549379B2Publication Date: 2013-10-01
- Inventor: Alfred L. Rodriguez , Nicholas J. Possley , Kevin Boshears , Austin H. Lesea , Jameel Hussein
- Applicant: Alfred L. Rodriguez , Nicholas J. Possley , Kevin Boshears , Austin H. Lesea , Jameel Hussein
- Applicant Address: US CA San Jose
- Assignee: Xilinx, Inc.
- Current Assignee: Xilinx, Inc.
- Current Assignee Address: US CA San Jose
- Agent LeRoy D. Maunu
- Main IPC: G06F11/00
- IPC: G06F11/00
Abstract:
Methods and systems mitigate a soft error in an integrated circuit. A map is stored in a memory, and the map specifies a criticality class for each storage bit in the integrated circuit. A mitigative technique is associated with each criticality class. The soft error is detected in a corrupted one of the storage bits. The mitigative technique is performed that is associated with the criticality class specified in the map for the corrupted storage bit.
Public/Granted literature
- US20120131417A1 CLASSIFYING A CRITICALITY OF A SOFT ERROR AND MITIGATING THE SOFT ERROR BASED ON THE CRITICALITY Public/Granted day:2012-05-24
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