Invention Grant
- Patent Title: Automated defect classification for program code
- Patent Title (中): 程序代码的自动缺陷分类
-
Application No.: US13406620Application Date: 2012-02-28
-
Publication No.: US08549465B2Publication Date: 2013-10-01
- Inventor: Corville O. Allen , Albert A. Chung , Binh C. Truong , Kam K. Yee
- Applicant: Corville O. Allen , Albert A. Chung , Binh C. Truong , Kam K. Yee
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Carey, Rodriguez, Greenberg & O'Keefe
- Agent Steven M. Greenberg, Esq.
- Main IPC: G06F9/44
- IPC: G06F9/44

Abstract:
Embodiments of the present invention address deficiencies of the art in respect to defect classification for software development and provide a method, system and computer program product for automated defect classification in a software development tool. In an embodiment of the invention, a defect classification method can be provided. The method can include computing differences between versions of a line of source code, lexically analyzing the computed differences to produce a lexical construct, mapping the lexical construct to a classification, and assigning the defect classification to the line of source code.
Public/Granted literature
- US20120222007A1 AUTOMATED DEFECT CLASSIFICATION Public/Granted day:2012-08-30
Information query