Invention Grant
- Patent Title: Apparatus and method for application testing of embedded system
- Patent Title (中): 嵌入式系统应用测试装置及方法
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Application No.: US12620755Application Date: 2009-11-18
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Publication No.: US08549491B2Publication Date: 2013-10-01
- Inventor: Ingeol Chun , Taeho Kim , Chaedeok Lim , Seungmin Park
- Applicant: Ingeol Chun , Taeho Kim , Chaedeok Lim , Seungmin Park
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Agency: Staas & Halsey LLP
- Priority: KR10-2008-0123471 20081205; KR10-2009-0041124 20090512
- Main IPC: G06F9/44
- IPC: G06F9/44

Abstract:
Provided is to an apparatus for application testing of an embedded system which can cross-develop an application program installed in the embedded system regardless of the type of a target system. A virtual environment for testing the application program adopted in the target system is constructed on the basis of information inputted through a user interface and the application program is tested by configuring a virtual target system in the constructed virtual environment. According to the present invention, the application program adopted in the target system can be developed and tested without constructing a cross-development environment for each target system in an environment in which various kinds of embedded systems are developed.
Public/Granted literature
- US20100146487A1 APPARATUS AND METHOD FOR APPLICATION TESTING OF EMBEDDED SYSTEM Public/Granted day:2010-06-10
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