Invention Grant
- Patent Title: Temperature measuring device
- Patent Title (中): 温度测量装置
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Application No.: US12115735Application Date: 2008-05-06
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Publication No.: US08550706B2Publication Date: 2013-10-08
- Inventor: Koji Ota
- Applicant: Koji Ota
- Applicant Address: JP Tokyo
- Assignee: Yokogawa Electric Corporation
- Current Assignee: Yokogawa Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2007-154207 20070611
- Main IPC: G01K15/00
- IPC: G01K15/00 ; G01K7/02 ; G01K7/13

Abstract:
There is provided a temperature measuring device capable of achieving cost reduction even in the case where the same is a multichannel temperature measuring device. The temperature-measuring device comprises a thermocouple having two dissimilar metal wires, ends thereof, on one-side, being joined with each other, and the other ends thereof, being connected to one pair of contact terminals, respectively, a unit of a temperature-measurement set made up by joining together a plurality of the thermocouples, and a reference junction compensation circuit provided for every unit of the temperature-measurement set, wherein at least one of the reference junction compensation circuits of the temperature-measuring device is left out while the other reference junction compensation circuits of the temperature-measuring device are removed upon a plurality of the units of the temperature-measurement sets being disposed in series.
Public/Granted literature
- US20080304547A1 TEMPERATURE MEASURING DEVICE Public/Granted day:2008-12-11
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