Invention Grant
- Patent Title: Methods for determining the degree of deposition of contaminants
- Patent Title (中): 确定污染物沉积程度的方法
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Application No.: US13501791Application Date: 2010-10-13
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Publication No.: US08551292B2Publication Date: 2013-10-08
- Inventor: Shisei Goto , Yasunobu Ooka , Kosuke Okamoto
- Applicant: Shisei Goto , Yasunobu Ooka , Kosuke Okamoto
- Applicant Address: JP Tokyo
- Assignee: Nippon Paper Industries Co., Ltd.
- Current Assignee: Nippon Paper Industries Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Roylance, Abrams, Berdo & Goodman, L.L.P.
- Priority: JP2009-237759 20091014
- International Application: PCT/JP2010/067919 WO 20101013
- International Announcement: WO2011/046130 WO 20110421
- Main IPC: D21F11/00
- IPC: D21F11/00

Abstract:
Herein provided are methods for determining deposition of contaminants significantly influencing machine runnability or product quality in manufacturing processes of pulp and paper, especially determining the degree of deposition and the morphology of deposits of sticky contaminants or pitch and for evaluating the effect of chemicals for reducing deposition.In a manufacturing process of pulp and paper is used a method comprising: determining the degree of deposition of a contaminant from a liquid or slurry on a quartz crystal oscillator; and quantifying the morphology of deposits on the surface of the quartz crystal oscillator by image analysis. Further, a method comprising adding a chemical for reducing deposition to the liquid or slurry and then quantifying the degree of deposition and the morphology of deposits is used to evaluate the effect of the chemical.
Public/Granted literature
- US20120211190A1 METHODS FOR DETERMINING THE DEGREE OF DEPOSITION OF CONTAMINANTS Public/Granted day:2012-08-23
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