Invention Grant
- Patent Title: Spectral detector
- Patent Title (中): 光谱检测器
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Application No.: US13121430Application Date: 2009-09-24
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Publication No.: US08552374B2Publication Date: 2013-10-08
- Inventor: Rifat A. M. Hikmet , Eduard J. Meijer , Ties Van Bommel
- Applicant: Rifat A. M. Hikmet , Eduard J. Meijer , Ties Van Bommel
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips N.V.
- Current Assignee: Koninklijke Philips N.V.
- Current Assignee Address: NL Eindhoven
- Agent Mark L. Beloborodov
- Priority: EP08165742 20081002
- International Application: PCT/IB2009/054187 WO 20090924
- International Announcement: WO2010/038175 WO 20100408
- Main IPC: G02F1/13
- IPC: G02F1/13

Abstract:
The invention relates to a spectral detector for measuring properties of light over portions of the electromagnetic spectrum including cholesteric liquid crystal material and switching means capable of varying the pitch of the helix of the cholesteric liquid crystal material, so that the position of the transmission wavelength band is adjusted in response to the switching means. The spectral detector may further include at least one light direction selecting structure for selecting light incident on the spectral detector having a certain angle of incidence. This invention also relates to a lighting system including the spectral detector of the invention.
Public/Granted literature
- US20110174977A1 SPECTRAL DETECTOR Public/Granted day:2011-07-21
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