Invention Grant
US08552387B2 Method for determining radiation attenuation by an examination object in a positron emission tomography scanner
有权
用于通过正电子发射断层摄影扫描仪中的检查对象来确定辐射衰减的方法
- Patent Title: Method for determining radiation attenuation by an examination object in a positron emission tomography scanner
- Patent Title (中): 用于通过正电子发射断层摄影扫描仪中的检查对象来确定辐射衰减的方法
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Application No.: US13158727Application Date: 2011-06-13
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Publication No.: US08552387B2Publication Date: 2013-10-08
- Inventor: Matthias Fenchel
- Applicant: Matthias Fenchel
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: DE102010023847 20100615
- Main IPC: G01T1/166
- IPC: G01T1/166

Abstract:
In an embodiment, an initial segmentation of an examination object is fixed, wherein an attenuation coefficient is assigned to each segment of the segmentation. Raw radiation data about the examination object arranged in the positron emission tomography scanner is acquired, and a correction factor is determined for each pixel with the aid of an optimization method, in which the probability of the acquired raw radiation data is maximized taking into account the segmentation and the attenuation coefficients assigned to the segments. A statistical parameter of the correction factors is determined for each segment and the segmentation is corrected by subdividing a segment as a function of the statistical parameter determined for the segment. A segment correction factor is determined for each segment from the correction factors assigned to the segment and the attenuation coefficients assigned to the segments are corrected as a function of the segment correction factors.
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