Invention Grant
US08552402B2 Super-resolution microscopy system using speckle illumination and array signal processing
有权
超分辨率显微镜系统采用斑点照明和阵列信号处理
- Patent Title: Super-resolution microscopy system using speckle illumination and array signal processing
- Patent Title (中): 超分辨率显微镜系统采用斑点照明和阵列信号处理
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Application No.: US13267051Application Date: 2011-10-06
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Publication No.: US08552402B2Publication Date: 2013-10-08
- Inventor: Jong Chul Ye , Jae Duck Jang
- Applicant: Jong Chul Ye , Jae Duck Jang
- Applicant Address: KR Daejeon
- Assignee: Korea Advanced Institute of Science and Technology
- Current Assignee: Korea Advanced Institute of Science and Technology
- Current Assignee Address: KR Daejeon
- Agency: Choate, Hall & Stewart LLP
- Agent Andrea L. C. Robidoux; Daniel S. Matthews
- Priority: KR10-2011-0032783 20110408
- Main IPC: G01N21/64
- IPC: G01N21/64

Abstract:
A nano-scale resolution fluorescence microscopy system and a method of obtaining an image using the nano-scale resolution microscopy system, and more particularly, a method and a microscopy system, capable of observing fluorescence probes in high resolution by radiating an irregular diffused light to have an incoherent speckle pattern that has low correlation in an adjacent space are disclosed. According to embodiments of the present invention, a diffraction limit of a fluorescence microscope may be overcome, and a super high resolution image on a nanometer scale may be obtained.
Public/Granted literature
- US20120256101A1 SUPER-RESOLUTION MICROSCOPY SYSTEM USING SPECKLE ILLUMINATION AND ARRAY SIGNAL PROCESSING Public/Granted day:2012-10-11
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