Invention Grant
- Patent Title: Particle beam irradiation apparatus and control method of the particle beam irradiation apparatus
- Patent Title (中): 粒子束照射装置及粒子束照射装置的控制方法
-
Application No.: US13577741Application Date: 2011-02-07
-
Publication No.: US08552408B2Publication Date: 2013-10-08
- Inventor: Katsushi Hanawa , Yasushi Iseki , Nobukazu Kakutani , Takuji Furukawa , Taku Inaniwa , Shinji Sato , Kouji Noda
- Applicant: Katsushi Hanawa , Yasushi Iseki , Nobukazu Kakutani , Takuji Furukawa , Taku Inaniwa , Shinji Sato , Kouji Noda
- Applicant Address: JP Tokyo JP Chiba-Shi
- Assignee: Kabushiki Kaisha Toshiba,National Institute of Radiological Sciences
- Current Assignee: Kabushiki Kaisha Toshiba,National Institute of Radiological Sciences
- Current Assignee Address: JP Tokyo JP Chiba-Shi
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2010-028046 20100210
- International Application: PCT/JP2011/052522 WO 20110207
- International Announcement: WO2011/099448 WO 20110818
- Main IPC: A61N5/10
- IPC: A61N5/10

Abstract:
Provided is a particle beam irradiation apparatus capable of highly reliable measurement of a dose of each beam and capable of highly sensitive measurement of a leakage dose caused by momentary beam emission. The particle beam irradiation apparatus according to the present invention includes: an emission control portion that controls emission and termination of a particle beam; a control portion that sequentially changes an irradiation position of the particle beam relative to an affected area; first and second dosimeters that measure dose rates of the particle beam directed to the affected area; and an abnormality determination portion that accumulates the dose rates output from the first and second dosimeters for each of predetermined determination periods to calculate first and second sectional dose measurement values and that performs second abnormality determination of determining that there is an abnormality and outputs an interlock signal for terminating the emission of the particle beam in at least one of a case in which the first sectional dose measurement value exceeds a predetermined first reference range and a case in which the second sectional dose measurement value exceeds a predetermined second reference range.
Public/Granted literature
- US20120305790A1 PARTICLE BEAM IRRADIATION APPARATUS AND CONTROL METHOD OF THE PARTICLE BEAM IRRADIATION APPARATUS Public/Granted day:2012-12-06
Information query